Impact of parameter variations on FinFET faults.

Bibliographic Details
Title:	Impact of parameter variations on FinFET faults.
Authors:	Harutyunyan, G., Tshagharyan, G., Zorian, Y.
Source:	2015 IEEE 33rd VLSI Test Symposium (VTS); 2015, p1-4, 4p
Database:	Complementary Index

Description
ISBN:	9781479975976
DOI:	10.1109/VTS.2015.7116276