Academic Journal
Two Powerful Tests for Parent-of-Origin Effects at Quantitative Trait Loci on the X Chromosome
| Τίτλος: | Two Powerful Tests for Parent-of-Origin Effects at Quantitative Trait Loci on the X Chromosome |
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| Συγγραφείς: | Lau, Pui Yin, Yeung, Kar Fu, Zhou, Ji-Yuan, Fung, Wing Kam |
| Πηγή: | Human Heredity, 2017 Jan 01. 83(5), 250-273. |
| Σύνδεσμος πρόσβασης: | https://www.jstor.org/stable/48506854 |
| Βάση Δεδομένων: | JSTOR Journals |
| ISSN: | 00015652 14230062 |
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