Conference
Checks on temperature during on-wafer I-V characterization of Si diodes made with 2-D interfacial layers
| Τίτλος: | Checks on temperature during on-wafer I-V characterization of Si diodes made with 2-D interfacial layers |
|---|---|
| Συγγραφείς: | van Zoeren, J., Nanver, L.K. |
| Πηγή: | 2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2022 IEEE 34th International Conference on. :1-6 Mar, 2022 |
| Relation: | 2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS) |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
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