Λεπτομέρειες βιβλιογραφικής εγγραφής
| Τίτλος: |
Checks on temperature during on-wafer I-V characterization of Si diodes made with 2-D interfacial layers |
| Συγγραφείς: |
van Zoeren, J., Nanver, L.K. |
| Πηγή: |
2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2022 IEEE 34th International Conference on. :1-6 Mar, 2022 |
| Relation: |
2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS) |
| Βάση Δεδομένων: |
IEEE Xplore Digital Library |