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Checks on temperature during on-wafer I-V characterization of Si diodes made with 2-D interfacial layers

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Τίτλος: Checks on temperature during on-wafer I-V characterization of Si diodes made with 2-D interfacial layers
Συγγραφείς: van Zoeren, J., Nanver, L.K.
Πηγή: 2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2022 IEEE 34th International Conference on. :1-6 Mar, 2022
Relation: 2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS)
Βάση Δεδομένων: IEEE Xplore Digital Library
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        Value: 10.1109/ICMTS50340.2022.9898239
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              Y: 2022
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