van Zoeren, J., & Nanver, L. (2022). Checks on temperature during on-wafer I-V characterization of Si diodes made with 2-D interfacial layers. 2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS), Microelectronic Test Structures (ICMTS), 2022 IEEE 34th International Conference on, 1. https://doi.org/10.1109/ICMTS50340.2022.9898239
Παραπομπή σε μορφή Chicago (17η εκδ.)van Zoeren, J., και L.K Nanver. "Checks on Temperature During On-wafer I-V Characterization of Si Diodes Made with 2-D Interfacial Layers." 2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS), Microelectronic Test Structures (ICMTS), 2022 IEEE 34th International Conference on 2022: 1. https://doi.org/10.1109/ICMTS50340.2022.9898239.
Παραπομπή σε μορφή MLA (9th εκδ.)van Zoeren, J., και L.K Nanver. "Checks on Temperature During On-wafer I-V Characterization of Si Diodes Made with 2-D Interfacial Layers." 2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS), Microelectronic Test Structures (ICMTS), 2022 IEEE 34th International Conference on, 2022, p. 1, https://doi.org/10.1109/ICMTS50340.2022.9898239.