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Fault Coverage Analysis using Sneak Path based Testing in Memristor Circuits

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Τίτλος: Fault Coverage Analysis using Sneak Path based Testing in Memristor Circuits
Συγγραφείς: Joshi, Rasika, Acken, John M
Πηγή: 2022 IEEE 31st Microelectronics Design & Test Symposium (MDTS) Microelectronics Design & Test Symposium (MDTS), 2022 IEEE 31st. :1-6 May, 2022
Relation: 2022 IEEE 31st Microelectronics Design & Test Symposium (MDTS)
Βάση Δεδομένων: IEEE Xplore Digital Library
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Header DbId: edseee
DbLabel: IEEE Xplore Digital Library
An: edseee.9826959
RelevancyScore: 1040
AccessLevel: 2
PubType: Conference
PubTypeId: conference
PreciseRelevancyScore: 1040.33251953125
IllustrationInfo
Items – Name: Title
  Label: Title
  Group: Ti
  Data: Fault Coverage Analysis using Sneak Path based Testing in Memristor Circuits
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Joshi%2C+Rasika%22">Joshi, Rasika</searchLink><br /><searchLink fieldCode="AR" term="%22Acken%2C+John+M%22">Acken, John M</searchLink>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: 2022 IEEE 31st Microelectronics Design & Test Symposium (MDTS) Microelectronics Design & Test Symposium (MDTS), 2022 IEEE 31st. :1-6 May, 2022
– Name: NoteTitleSource
  Label: Relation
  Group: SrcInfo
  Data: 2022 IEEE 31st Microelectronics Design & Test Symposium (MDTS)
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=edseee&AN=edseee.9826959
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1109/MDTS54894.2022.9826959
    PhysicalDescription:
      Pagination:
        PageCount: 6
        StartPage: 1
    Titles:
      – TitleFull: Fault Coverage Analysis using Sneak Path based Testing in Memristor Circuits
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Joshi, Rasika
      – PersonEntity:
          Name:
            NameFull: Acken, John M
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 23
              M: 05
              Type: published
              Y: 2022
          Identifiers:
            – Type: isbn-print
              Value: 9781665468169
            – Type: issn-print
              Value: 25737600
            – Type: issn-locals
              Value: edseee.IEEEConferenc
          Titles:
            – TitleFull: 2022 IEEE 31st Microelectronics Design & Test Symposium (MDTS), Microelectronics Design & Test Symposium (MDTS), 2022 IEEE 31st
              Type: main
ResultId 1