Conference
Fault Coverage Analysis using Sneak Path based Testing in Memristor Circuits
| Τίτλος: | Fault Coverage Analysis using Sneak Path based Testing in Memristor Circuits |
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| Συγγραφείς: | Joshi, Rasika, Acken, John M |
| Πηγή: | 2022 IEEE 31st Microelectronics Design & Test Symposium (MDTS) Microelectronics Design & Test Symposium (MDTS), 2022 IEEE 31st. :1-6 May, 2022 |
| Relation: | 2022 IEEE 31st Microelectronics Design & Test Symposium (MDTS) |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
| ISBN: | 9781665468169 |
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| ISSN: | 25737600 |
| DOI: | 10.1109/MDTS54894.2022.9826959 |