Joshi, R., & Acken, J. M. (2022). Fault Coverage Analysis using Sneak Path based Testing in Memristor Circuits. 2022 IEEE 31st Microelectronics Design & Test Symposium (MDTS), Microelectronics Design & Test Symposium (MDTS), 2022 IEEE 31st, 1. https://doi.org/10.1109/MDTS54894.2022.9826959
Παραπομπή σε μορφή Chicago (17η εκδ.)Joshi, Rasika, και John M. Acken. "Fault Coverage Analysis Using Sneak Path Based Testing in Memristor Circuits." 2022 IEEE 31st Microelectronics Design & Test Symposium (MDTS), Microelectronics Design & Test Symposium (MDTS), 2022 IEEE 31st 2022: 1. https://doi.org/10.1109/MDTS54894.2022.9826959.
Παραπομπή σε μορφή MLA (9th εκδ.)Joshi, Rasika, και John M. Acken. "Fault Coverage Analysis Using Sneak Path Based Testing in Memristor Circuits." 2022 IEEE 31st Microelectronics Design & Test Symposium (MDTS), Microelectronics Design & Test Symposium (MDTS), 2022 IEEE 31st, 2022, p. 1, https://doi.org/10.1109/MDTS54894.2022.9826959.