Ultrathin CVD barrier/seed for 0.1 /spl mu/m dual damascene Cu interconnects

Λεπτομέρειες βιβλιογραφικής εγγραφής
Τίτλος: Ultrathin CVD barrier/seed for 0.1 /spl mu/m dual damascene Cu interconnects
Συγγραφείς: Block, C., McGregor, P., Kuhn, M., Drosd, C.
Πηγή: Proceedings of the IEEE 2001 International Interconnect Technology Conference (Cat. No.01EX461) Interconnect technology conference Interconnect Technology Conference, 2001. Proceedings of the IEEE 2001 International. :210-212 2001
Relation: Proceedings of the IEEE 2001 International Interconnect Technology Conference
Βάση Δεδομένων: IEEE Xplore Digital Library
Περιγραφή
ISBN:0780366786
9780780366787
DOI:10.1109/IITC.2001.930063