Fonmal Verification of Coarse-Grained Parallel Programs for Embedded Microelectronic Systems

Λεπτομέρειες βιβλιογραφικής εγγραφής
Τίτλος: Fonmal Verification of Coarse-Grained Parallel Programs for Embedded Microelectronic Systems
Συγγραφείς: Pakharev, S.M., Syschikov, A.Y.
Πηγή: 2018 Wave Electronics and its Application in Information and Telecommunication Systems (WECONF) Wave Electronics and its Application in Information and Telecommunication Systems (WECONF), 2018. :1-6 Nov, 2018
Relation: 2018 Wave Electronics and its Application in Information and Telecommunication Systems (WECONF)
Βάση Δεδομένων: IEEE Xplore Digital Library