Conference

Fonmal Verification of Coarse-Grained Parallel Programs for Embedded Microelectronic Systems

Bibliographic Details
Title: Fonmal Verification of Coarse-Grained Parallel Programs for Embedded Microelectronic Systems
Authors: Pakharev, S.M., Syschikov, A.Y.
Source: 2018 Wave Electronics and its Application in Information and Telecommunication Systems (WECONF) Wave Electronics and its Application in Information and Telecommunication Systems (WECONF), 2018. :1-6 Nov, 2018
Relation: 2018 Wave Electronics and its Application in Information and Telecommunication Systems (WECONF)
Database: IEEE Xplore Digital Library
Description
ISBN:9781538676325
DOI:10.1109/WECONF.2018.8604425