Pakharev, S., & Syschikov, A. (2018). Fonmal Verification of Coarse-Grained Parallel Programs for Embedded Microelectronic Systems. 2018 Wave Electronics and its Application in Information and Telecommunication Systems (WECONF), Wave Electronics and its Application in Information and Telecommunication Systems (WECONF), 2018, 1. https://doi.org/10.1109/WECONF.2018.8604425
Παραπομπή σε μορφή Chicago (17η εκδ.)Pakharev, S.M, και A.Y Syschikov. "Fonmal Verification of Coarse-Grained Parallel Programs for Embedded Microelectronic Systems." 2018 Wave Electronics and Its Application in Information and Telecommunication Systems (WECONF), Wave Electronics and Its Application in Information and Telecommunication Systems (WECONF), 2018 2018: 1. https://doi.org/10.1109/WECONF.2018.8604425.
Παραπομπή σε μορφή MLA (9th εκδ.)Pakharev, S.M, και A.Y Syschikov. "Fonmal Verification of Coarse-Grained Parallel Programs for Embedded Microelectronic Systems." 2018 Wave Electronics and Its Application in Information and Telecommunication Systems (WECONF), Wave Electronics and Its Application in Information and Telecommunication Systems (WECONF), 2018, 2018, p. 1, https://doi.org/10.1109/WECONF.2018.8604425.