Design and control of interface reaction between Al-based dielectrics and AlGaN layer for hysteresis-free AlGaN/GaN MOS-HFETs

Λεπτομέρειες βιβλιογραφικής εγγραφής
Τίτλος: Design and control of interface reaction between Al-based dielectrics and AlGaN layer for hysteresis-free AlGaN/GaN MOS-HFETs
Συγγραφείς: Watanabe, K., Nozaki, M., Yamada, T., Nakazawa, S., Anda, Y., Isliida, M., Ueda, T., Yoshigoe, A., Hosoi, T., Shimura, T., Watanabe, H.
Πηγή: 2017 29th International Symposium on Power Semiconductor Devices and IC's (ISPSD) Power Semiconductor Devices and IC's (ISPSD), 2017 29th International Symposium on. :219-222 May, 2017
Relation: 2017 29th International Symposium on Power Semiconductor Devices and IC's (ISPSD)
Βάση Δεδομένων: IEEE Xplore Digital Library
Περιγραφή
ISBN:9784886860941
9784886860965
9784886860958
ISSN:19460201
DOI:10.23919/ISPSD.2017.7988927