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Electrical property and reliability of quasi-double SOI MOSFET

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Τίτλος: Electrical property and reliability of quasi-double SOI MOSFET
Συγγραφείς: Mao, Guang, Xie, Lei, Ren, Shangqing, Yang, Renhua, Liu, Xin, Zhong, Le, Lv, Qiuye, Peng, Yong
Πηγή: 2016 International Conference on Integrated Circuits and Microsystems (ICICM) Integrated Circuits and Microsystems (ICICM), International Conference on. :191-194 Nov, 2016
Relation: 2016 International Conference on Integrated Circuits and Microsystems (ICICM)
Βάση Δεδομένων: IEEE Xplore Digital Library
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        Value: 10.1109/ICAM.2016.7813590
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            NameFull: Xie, Lei
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            NameFull: Ren, Shangqing
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            NameFull: Yang, Renhua
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            NameFull: Zhong, Le
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              Y: 2016
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