Conference
Electrical property and reliability of quasi-double SOI MOSFET
| Τίτλος: | Electrical property and reliability of quasi-double SOI MOSFET |
|---|---|
| Συγγραφείς: | Mao, Guang, Xie, Lei, Ren, Shangqing, Yang, Renhua, Liu, Xin, Zhong, Le, Lv, Qiuye, Peng, Yong |
| Πηγή: | 2016 International Conference on Integrated Circuits and Microsystems (ICICM) Integrated Circuits and Microsystems (ICICM), International Conference on. :191-194 Nov, 2016 |
| Relation: | 2016 International Conference on Integrated Circuits and Microsystems (ICICM) |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
| ISBN: | 9781509028139 9781509028146 |
|---|---|
| DOI: | 10.1109/ICAM.2016.7813590 |