Mao, G., Xie, L., Ren, S., Yang, R., Liu, X., Zhong, L., . . . Peng, Y. (2016). Electrical property and reliability of quasi-double SOI MOSFET. 2016 International Conference on Integrated Circuits and Microsystems (ICICM), Integrated Circuits and Microsystems (ICICM), International Conference on, 191. https://doi.org/10.1109/ICAM.2016.7813590
Παραπομπή σε μορφή Chicago (17η εκδ.)Mao, Guang, Lei Xie, Shangqing Ren, Renhua Yang, Xin Liu, Le Zhong, Qiuye Lv, και Yong Peng. "Electrical Property and Reliability of Quasi-double SOI MOSFET." 2016 International Conference on Integrated Circuits and Microsystems (ICICM), Integrated Circuits and Microsystems (ICICM), International Conference on 2016: 191. https://doi.org/10.1109/ICAM.2016.7813590.
Παραπομπή σε μορφή MLA (9th εκδ.)Mao, Guang, et al. "Electrical Property and Reliability of Quasi-double SOI MOSFET." 2016 International Conference on Integrated Circuits and Microsystems (ICICM), Integrated Circuits and Microsystems (ICICM), International Conference on, 2016, p. 191, https://doi.org/10.1109/ICAM.2016.7813590.