Conference
Dynamic pixel test pattern for CMOS image sensor
| Τίτλος: | Dynamic pixel test pattern for CMOS image sensor |
|---|---|
| Συγγραφείς: | Lee, KS, Lee, HJ, Jang, MJ, Kim, JC, Kim, ST, Moon, JW, Cho, IW, Yoo, KD |
| Πηγή: | 2012 IEEE International Conference on Microelectronic Test Structures Microelectronic Test Structures (ICMTS), 2012 IEEE International Conference on. :111-113 Mar, 2012 |
| Relation: | 2012 IEEE International Conference on Microelectronic Test Structures (ICMTS) |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
καταχωρήστε σχόλιο πρώτοι!