Conference
Dynamic pixel test pattern for CMOS image sensor
| Τίτλος: | Dynamic pixel test pattern for CMOS image sensor |
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| Συγγραφείς: | Lee, KS, Lee, HJ, Jang, MJ, Kim, JC, Kim, ST, Moon, JW, Cho, IW, Yoo, KD |
| Πηγή: | 2012 IEEE International Conference on Microelectronic Test Structures Microelectronic Test Structures (ICMTS), 2012 IEEE International Conference on. :111-113 Mar, 2012 |
| Relation: | 2012 IEEE International Conference on Microelectronic Test Structures (ICMTS) |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
| ISBN: | 9781467310277 9781467310291 9781467310307 |
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| ISSN: | 10719032 21581029 |
| DOI: | 10.1109/ICMTS.2012.6190617 |