Conference

Dynamic pixel test pattern for CMOS image sensor

Bibliographic Details
Title: Dynamic pixel test pattern for CMOS image sensor
Authors: Lee, KS, Lee, HJ, Jang, MJ, Kim, JC, Kim, ST, Moon, JW, Cho, IW, Yoo, KD
Source: 2012 IEEE International Conference on Microelectronic Test Structures Microelectronic Test Structures (ICMTS), 2012 IEEE International Conference on. :111-113 Mar, 2012
Relation: 2012 IEEE International Conference on Microelectronic Test Structures (ICMTS)
Database: IEEE Xplore Digital Library
Description
ISBN:9781467310277
9781467310291
9781467310307
ISSN:10719032
21581029
DOI:10.1109/ICMTS.2012.6190617