Lee, K., Lee, H., Jang, M., Kim, J., Kim, S., Moon, J., . . . Yoo, K. (2012). Dynamic pixel test pattern for CMOS image sensor. 2012 IEEE International Conference on Microelectronic Test Structures, Microelectronic Test Structures (ICMTS), 2012 IEEE International Conference on, 111. https://doi.org/10.1109/ICMTS.2012.6190617
Παραπομπή σε μορφή Chicago (17η εκδ.)Lee, KS, HJ Lee, MJ Jang, JC Kim, ST Kim, JW Moon, IW Cho, και KD Yoo. "Dynamic Pixel Test Pattern for CMOS Image Sensor." 2012 IEEE International Conference on Microelectronic Test Structures, Microelectronic Test Structures (ICMTS), 2012 IEEE International Conference on 2012: 111. https://doi.org/10.1109/ICMTS.2012.6190617.
Παραπομπή σε μορφή MLA (9th εκδ.)Lee, KS, et al. "Dynamic Pixel Test Pattern for CMOS Image Sensor." 2012 IEEE International Conference on Microelectronic Test Structures, Microelectronic Test Structures (ICMTS), 2012 IEEE International Conference on, 2012, p. 111, https://doi.org/10.1109/ICMTS.2012.6190617.