Conference

Characterizing Data Structures for Volatile Forensics

Bibliographic Details
Title: Characterizing Data Structures for Volatile Forensics
Authors: Chan, Ellick, Venkataraman, Shivaram, Tkach, Nadia, Larson, Kevin, Gutierrez, Alejandro, Campbell, Roy H.
Source: 2011 Sixth IEEE International Workshop on Systematic Approaches to Digital Forensic Engineering Systematic Approaches to Digital Forensic Engineering (SADFE), 2011 IEEE Sixth International Workshop on. :1-9 May, 2011
Relation: 2011 IEEE Sixth International Workshop on Systematic Approaches to Digital Forensic Engineering (SADFE)
Database: IEEE Xplore Digital Library
Description
ISBN:9781467312424
9780769546421
DOI:10.1109/SADFE.2011.5