Conference
Characterizing Data Structures for Volatile Forensics
| Τίτλος: | Characterizing Data Structures for Volatile Forensics |
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| Συγγραφείς: | Chan, Ellick, Venkataraman, Shivaram, Tkach, Nadia, Larson, Kevin, Gutierrez, Alejandro, Campbell, Roy H. |
| Πηγή: | 2011 Sixth IEEE International Workshop on Systematic Approaches to Digital Forensic Engineering Systematic Approaches to Digital Forensic Engineering (SADFE), 2011 IEEE Sixth International Workshop on. :1-9 May, 2011 |
| Relation: | 2011 IEEE Sixth International Workshop on Systematic Approaches to Digital Forensic Engineering (SADFE) |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
| ISBN: | 9781467312424 9780769546421 |
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| DOI: | 10.1109/SADFE.2011.5 |