Chan, E., Venkataraman, S., Tkach, N., Larson, K., Gutierrez, A., & Campbell, R. H. (2011). Characterizing Data Structures for Volatile Forensics. 2011 Sixth IEEE International Workshop on Systematic Approaches to Digital Forensic Engineering, Systematic Approaches to Digital Forensic Engineering (SADFE), 2011 IEEE Sixth International Workshop on, 1. https://doi.org/10.1109/SADFE.2011.5
Παραπομπή σε μορφή Chicago (17η εκδ.)Chan, Ellick, Shivaram Venkataraman, Nadia Tkach, Kevin Larson, Alejandro Gutierrez, και Roy H. Campbell. "Characterizing Data Structures for Volatile Forensics." 2011 Sixth IEEE International Workshop on Systematic Approaches to Digital Forensic Engineering, Systematic Approaches to Digital Forensic Engineering (SADFE), 2011 IEEE Sixth International Workshop on 2011: 1. https://doi.org/10.1109/SADFE.2011.5.
Παραπομπή σε μορφή MLA (9th εκδ.)Chan, Ellick, et al. "Characterizing Data Structures for Volatile Forensics." 2011 Sixth IEEE International Workshop on Systematic Approaches to Digital Forensic Engineering, Systematic Approaches to Digital Forensic Engineering (SADFE), 2011 IEEE Sixth International Workshop on, 2011, p. 1, https://doi.org/10.1109/SADFE.2011.5.