Academic Journal
Exploring the Interaction Between Device Lifetime Reliability and Security Vulnerabilities
| Title: | Exploring the Interaction Between Device Lifetime Reliability and Security Vulnerabilities |
|---|---|
| Authors: | Ho, Chen-Han, Staus, Garret, Ullmer, Aaron, Sakaralingam, Karu |
| Source: | IEEE Computer Architecture Letters IEEE Comput. Arch. Lett. Computer Architecture Letters. 10(2):37-40 Dec, 2011 |
| Database: | IEEE Xplore Digital Library |
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