Academic Journal
Exploring the Interaction Between Device Lifetime Reliability and Security Vulnerabilities
| Τίτλος: | Exploring the Interaction Between Device Lifetime Reliability and Security Vulnerabilities |
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| Συγγραφείς: | Ho, Chen-Han, Staus, Garret, Ullmer, Aaron, Sakaralingam, Karu |
| Πηγή: | IEEE Computer Architecture Letters IEEE Comput. Arch. Lett. Computer Architecture Letters. 10(2):37-40 Dec, 2011 |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
| ISSN: | 15566056 15566064 24732575 |
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| DOI: | 10.1109/L-CA.2011.16 |