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Exploring the Interaction Between Device Lifetime Reliability and Security Vulnerabilities

Bibliographic Details
Title: Exploring the Interaction Between Device Lifetime Reliability and Security Vulnerabilities
Authors: Ho, Chen-Han, Staus, Garret, Ullmer, Aaron, Sakaralingam, Karu
Source: IEEE Computer Architecture Letters IEEE Comput. Arch. Lett. Computer Architecture Letters. 10(2):37-40 Dec, 2011
Database: IEEE Xplore Digital Library
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Header DbId: edseee
DbLabel: IEEE Xplore Digital Library
An: edseee.5934666
RelevancyScore: 948
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 947.734069824219
IllustrationInfo
Items – Name: Title
  Label: Title
  Group: Ti
  Data: Exploring the Interaction Between Device Lifetime Reliability and Security Vulnerabilities
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Ho%2C+Chen-Han%22">Ho, Chen-Han</searchLink><br /><searchLink fieldCode="AR" term="%22Staus%2C+Garret%22">Staus, Garret</searchLink><br /><searchLink fieldCode="AR" term="%22Ullmer%2C+Aaron%22">Ullmer, Aaron</searchLink><br /><searchLink fieldCode="AR" term="%22Sakaralingam%2C+Karu%22">Sakaralingam, Karu</searchLink>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: IEEE Computer Architecture Letters IEEE Comput. Arch. Lett. Computer Architecture Letters. 10(2):37-40 Dec, 2011
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=edseee&AN=edseee.5934666
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1109/L-CA.2011.16
    PhysicalDescription:
      Pagination:
        PageCount: 4
        StartPage: 37
    Titles:
      – TitleFull: Exploring the Interaction Between Device Lifetime Reliability and Security Vulnerabilities
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Ho, Chen-Han
      – PersonEntity:
          Name:
            NameFull: Staus, Garret
      – PersonEntity:
          Name:
            NameFull: Ullmer, Aaron
      – PersonEntity:
          Name:
            NameFull: Sakaralingam, Karu
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 07
              Type: published
              Y: 2011
          Identifiers:
            – Type: issn-print
              Value: 15566056
            – Type: issn-print
              Value: 15566064
            – Type: issn-print
              Value: 24732575
            – Type: issn-locals
              Value: edseee.IEEEJournals
          Numbering:
            – Type: volume
              Value: 10
            – Type: issue
              Value: 2
          Titles:
            – TitleFull: IEEE Computer Architecture Letters, Computer Architecture Letters, IEEE Comput. Arch. Lett.
              Type: main
ResultId 1