Ho, C., Staus, G., Ullmer, A., & Sakaralingam, K. (2011). Exploring the Interaction Between Device Lifetime Reliability and Security Vulnerabilities. IEEE Computer Architecture Letters, Computer Architecture Letters, IEEE Comput. Arch. Lett., 10(2), 37. https://doi.org/10.1109/L-CA.2011.16
Παραπομπή σε μορφή Chicago (17η εκδ.)Ho, Chen-Han, Garret Staus, Aaron Ullmer, και Karu Sakaralingam. "Exploring the Interaction Between Device Lifetime Reliability and Security Vulnerabilities." IEEE Computer Architecture Letters, Computer Architecture Letters, IEEE Comput. Arch. Lett. 10, no. 2 (2011): 37. https://doi.org/10.1109/L-CA.2011.16.
Παραπομπή σε μορφή MLA (9th εκδ.)Ho, Chen-Han, et al. "Exploring the Interaction Between Device Lifetime Reliability and Security Vulnerabilities." IEEE Computer Architecture Letters, Computer Architecture Letters, IEEE Comput. Arch. Lett., vol. 10, no. 2, 2011, p. 37, https://doi.org/10.1109/L-CA.2011.16.