Conference
Combining Unspecified Test Data Bit Filling Methods and Run Length Based Codes to Estimate Compression, Power and Area Overhead
| Τίτλος: | Combining Unspecified Test Data Bit Filling Methods and Run Length Based Codes to Estimate Compression, Power and Area Overhead |
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| Συγγραφείς: | Mehta, Usha S., Devashrayee, Niranjan M., Dasgupta, Kanker S. |
| Πηγή: | 2010 IEEE Computer Society Annual Symposium on VLSI VLSI (ISVLSI), 2010 IEEE Computer Society Annual Symposium on. :448-449 Jul, 2010 |
| Relation: | 2010 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
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