Conference
Combining Unspecified Test Data Bit Filling Methods and Run Length Based Codes to Estimate Compression, Power and Area Overhead
| Τίτλος: | Combining Unspecified Test Data Bit Filling Methods and Run Length Based Codes to Estimate Compression, Power and Area Overhead |
|---|---|
| Συγγραφείς: | Mehta, Usha S., Devashrayee, Niranjan M., Dasgupta, Kanker S. |
| Πηγή: | 2010 IEEE Computer Society Annual Symposium on VLSI VLSI (ISVLSI), 2010 IEEE Computer Society Annual Symposium on. :448-449 Jul, 2010 |
| Relation: | 2010 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
| ISBN: | 9781424473212 9780769540764 9781424473205 |
|---|---|
| ISSN: | 21593469 21593477 |
| DOI: | 10.1109/ISVLSI.2010.18 |