Conference
Combining Unspecified Test Data Bit Filling Methods and Run Length Based Codes to Estimate Compression, Power and Area Overhead
| Title: | Combining Unspecified Test Data Bit Filling Methods and Run Length Based Codes to Estimate Compression, Power and Area Overhead |
|---|---|
| Authors: | Mehta, Usha S., Devashrayee, Niranjan M., Dasgupta, Kanker S. |
| Source: | 2010 IEEE Computer Society Annual Symposium on VLSI VLSI (ISVLSI), 2010 IEEE Computer Society Annual Symposium on. :448-449 Jul, 2010 |
| Relation: | 2010 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) |
| Database: | IEEE Xplore Digital Library |
| FullText | Text: Availability: 0 |
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| Header | DbId: edseee DbLabel: IEEE Xplore Digital Library An: edseee.5572838 RelevancyScore: 924 AccessLevel: 2 PubType: Conference PubTypeId: conference PreciseRelevancyScore: 923.904113769531 |
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| Items | – Name: Title Label: Title Group: Ti Data: Combining Unspecified Test Data Bit Filling Methods and Run Length Based Codes to Estimate Compression, Power and Area Overhead – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Mehta%2C+Usha+S%2E%22">Mehta, Usha S.</searchLink><br /><searchLink fieldCode="AR" term="%22Devashrayee%2C+Niranjan+M%2E%22">Devashrayee, Niranjan M.</searchLink><br /><searchLink fieldCode="AR" term="%22Dasgupta%2C+Kanker+S%2E%22">Dasgupta, Kanker S.</searchLink> – Name: TitleSource Label: Source Group: Src Data: 2010 IEEE Computer Society Annual Symposium on VLSI VLSI (ISVLSI), 2010 IEEE Computer Society Annual Symposium on. :448-449 Jul, 2010 – Name: NoteTitleSource Label: Relation Group: SrcInfo Data: 2010 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=edseee&AN=edseee.5572838 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1109/ISVLSI.2010.18 PhysicalDescription: Pagination: PageCount: 2 StartPage: 448 Titles: – TitleFull: Combining Unspecified Test Data Bit Filling Methods and Run Length Based Codes to Estimate Compression, Power and Area Overhead Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Mehta, Usha S. – PersonEntity: Name: NameFull: Devashrayee, Niranjan M. – PersonEntity: Name: NameFull: Dasgupta, Kanker S. IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 07 Type: published Y: 2010 Identifiers: – Type: isbn-print Value: 9781424473212 – Type: isbn-print Value: 9780769540764 – Type: isbn-print Value: 9781424473205 – Type: issn-print Value: 21593469 – Type: issn-print Value: 21593477 – Type: issn-locals Value: edseee.IEEEConferenc Titles: – TitleFull: 2010 IEEE Computer Society Annual Symposium on VLSI, VLSI (ISVLSI), 2010 IEEE Computer Society Annual Symposium on Type: main |
| ResultId | 1 |