APA (7th ed.) Citation

Mehta, U. S., Devashrayee, N. M., & Dasgupta, K. S. (2010). Combining Unspecified Test Data Bit Filling Methods and Run Length Based Codes to Estimate Compression, Power and Area Overhead. 2010 IEEE Computer Society Annual Symposium on VLSI, VLSI (ISVLSI), 2010 IEEE Computer Society Annual Symposium on, 448. https://doi.org/10.1109/ISVLSI.2010.18

Chicago Style (17th ed.) Citation

Mehta, Usha S., Niranjan M. Devashrayee, and Kanker S. Dasgupta. "Combining Unspecified Test Data Bit Filling Methods and Run Length Based Codes to Estimate Compression, Power and Area Overhead." 2010 IEEE Computer Society Annual Symposium on VLSI, VLSI (ISVLSI), 2010 IEEE Computer Society Annual Symposium on 2010: 448. https://doi.org/10.1109/ISVLSI.2010.18.

MLA (9th ed.) Citation

Mehta, Usha S., et al. "Combining Unspecified Test Data Bit Filling Methods and Run Length Based Codes to Estimate Compression, Power and Area Overhead." 2010 IEEE Computer Society Annual Symposium on VLSI, VLSI (ISVLSI), 2010 IEEE Computer Society Annual Symposium on, 2010, p. 448, https://doi.org/10.1109/ISVLSI.2010.18.