Παραπομπή σε μορφή APA (7η εκδ.)

Gonzalez, A., Mahlke, S., Mukherjee, S., Sendag, R., Chiou, D., & Yi, J. J. (2007). Reliability: Fallacy or Reality? IEEE Micro, Micro, IEEE, 27(6), 36. https://doi.org/10.1109/MM.2007.107

Παραπομπή σε μορφή Chicago (17η εκδ.)

Gonzalez, Antonio, Scott Mahlke, Shubu Mukherjee, Resit Sendag, Derek Chiou, και Joshua J. Yi. "Reliability: Fallacy or Reality?" IEEE Micro, Micro, IEEE 27, no. 6 (2007): 36. https://doi.org/10.1109/MM.2007.107.

Παραπομπή σε μορφή MLA (9th εκδ.)

Gonzalez, Antonio, et al. "Reliability: Fallacy or Reality?" IEEE Micro, Micro, IEEE, vol. 27, no. 6, 2007, p. 36, https://doi.org/10.1109/MM.2007.107.