Academic Journal

Reliability: Fallacy or Reality?

Bibliographic Details
Title: Reliability: Fallacy or Reality?
Authors: Gonzalez, Antonio, Mahlke, Scott, Mukherjee, Shubu, Sendag, Resit, Chiou, Derek, Yi, Joshua J.
Source: IEEE Micro Micro, IEEE. 27(6):36-45 Jan, 2007
Database: IEEE Xplore Digital Library
Description
ISSN:02721732
19374143
DOI:10.1109/MM.2007.107