Conference
A Structured Conceptual Framework for Predictive Maintenance on an SMT Assembly Line: Failure Modes, Sensor Mapping, and Algorithm Selection
| Τίτλος: | A Structured Conceptual Framework for Predictive Maintenance on an SMT Assembly Line: Failure Modes, Sensor Mapping, and Algorithm Selection |
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| Συγγραφείς: | Jara, Tomas, Steiner, Frantisek, Tupa, Jiri, Rericha, Tomas |
| Πηγή: | 2026 International Conference on Diagnostics in Electrical Engineering (Diagnostika) Diagnostics in Electrical Engineering (Diagnostika), 2026 International Conference on. :1-6 Sep, 2026 |
| Relation: | 2026 International Conference on Diagnostics in Electrical Engineering (Diagnostika) |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
| ISBN: | 9798331563066 9798331563059 9798331563073 |
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| ISSN: | 2464708X 24647071 |
| DOI: | 10.1109/Diagnostika70212.2026.11717796 |