Conference
Precise Failure Localization of Integrated Circuits Based on Combined Analysis of EMMI, Mechanical Grinding, and FIB
| Τίτλος: | Precise Failure Localization of Integrated Circuits Based on Combined Analysis of EMMI, Mechanical Grinding, and FIB |
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| Συγγραφείς: | Sun, Zhe, Tao, Renxian, Liu, Tianhan |
| Πηγή: | 2026 27th International Conference on Electronic Packaging Technology (ICEPT) Electronic Packaging Technology (ICEPT), 2026 27th International Conference on. :1-4 Aug, 2026 |
| Relation: | 2026 27th International Conference on Electronic Packaging Technology (ICEPT) |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
| ISBN: | 9798319531117 9798319531124 |
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| ISSN: | 28369734 |
| DOI: | 10.1109/ICEPT71373.2026.11690014 |