High-Uniformity Large-Area Photoresist Removal Based on Optimization of Inductively Coupled Plasma (ICP) Source Architecture for Advanced Fan-out Panel-Level Packaging

Λεπτομέρειες βιβλιογραφικής εγγραφής
Τίτλος: High-Uniformity Large-Area Photoresist Removal Based on Optimization of Inductively Coupled Plasma (ICP) Source Architecture for Advanced Fan-out Panel-Level Packaging
Συγγραφείς: Li, Hai-Ping, Xian, Jian-Wei, Zhu, Yang-Lei, Ma, Xiao, Zhang, Xin-Ping
Πηγή: 2026 27th International Conference on Electronic Packaging Technology (ICEPT) Electronic Packaging Technology (ICEPT), 2026 27th International Conference on. :1-6 Aug, 2026
Relation: 2026 27th International Conference on Electronic Packaging Technology (ICEPT)
Βάση Δεδομένων: IEEE Xplore Digital Library