Conference
A New Method for Mitigating the Drift Effect in the Electrical Characterization of ISFETs
| Τίτλος: | A New Method for Mitigating the Drift Effect in the Electrical Characterization of ISFETs |
|---|---|
| Συγγραφείς: | Marques, Rafael de O., Duarte, Pedro H., Martino, Joao A., Rangel, Ricardo C. |
| Πηγή: | 2026 40th Symposium on Microelectronics Technology and Devices (SBMicro) Microelectronics Technology and Devices (SBMicro), 2026 40th Symposium on. :1-4 Aug, 2026 |
| Relation: | 2026 40th Symposium on Microelectronics Technology and Devices (SBMicro) |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
καταχωρήστε σχόλιο πρώτοι!