Conference
A New Method for Mitigating the Drift Effect in the Electrical Characterization of ISFETs
| Τίτλος: | A New Method for Mitigating the Drift Effect in the Electrical Characterization of ISFETs |
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| Συγγραφείς: | Marques, Rafael de O., Duarte, Pedro H., Martino, Joao A., Rangel, Ricardo C. |
| Πηγή: | 2026 40th Symposium on Microelectronics Technology and Devices (SBMicro) Microelectronics Technology and Devices (SBMicro), 2026 40th Symposium on. :1-4 Aug, 2026 |
| Relation: | 2026 40th Symposium on Microelectronics Technology and Devices (SBMicro) |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
| ISBN: | 9798319505194 9798319505200 |
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| ISSN: | 28324218 2832420X |
| DOI: | 10.1109/SBMicro70495.2026.11684446 |