Geometry Optimization of Amorphous In–Ga–Zn–O Thin-Film Transistors Based on Device Simulation and Multi-Indicator Weighted Evaluation

Λεπτομέρειες βιβλιογραφικής εγγραφής
Τίτλος: Geometry Optimization of Amorphous In–Ga–Zn–O Thin-Film Transistors Based on Device Simulation and Multi-Indicator Weighted Evaluation
Συγγραφείς: Deng, Wei, Li, Yan, Zhang, Fuqiang
Πηγή: 2026 5th International Symposium on Semiconductor and Electronic Technology (ISSET) Semiconductor and Electronic Technology (ISSET), 2026 5th International Symposium on. :140-143 Jul, 2026
Relation: 2026 5th International Symposium on Semiconductor and Electronic Technology (ISSET)
Βάση Δεδομένων: IEEE Xplore Digital Library
Περιγραφή
ISBN:9798319518224
9798319518217
9798319518231
DOI:10.1109/ISSET70600.2026.11682062