Pandey, M., & Lekkala, M. (2026). A Novel Verification Method for Debug Tracing-in Close Chassis System. 2026 IEEE 10th International Test Conference India (ITC India), Test Conference India (ITC India), 2026 IEEE 10th International, 1. https://doi.org/10.1109/ITCIndia70344.2026.11646554
Παραπομπή σε μορφή Chicago (17η εκδ.)Pandey, Maneesh, και Madhav Lekkala. "A Novel Verification Method for Debug Tracing-in Close Chassis System." 2026 IEEE 10th International Test Conference India (ITC India), Test Conference India (ITC India), 2026 IEEE 10th International 2026: 1. https://doi.org/10.1109/ITCIndia70344.2026.11646554.
Παραπομπή σε μορφή MLA (9th εκδ.)Pandey, Maneesh, και Madhav Lekkala. "A Novel Verification Method for Debug Tracing-in Close Chassis System." 2026 IEEE 10th International Test Conference India (ITC India), Test Conference India (ITC India), 2026 IEEE 10th International, 2026, p. 1, https://doi.org/10.1109/ITCIndia70344.2026.11646554.