Conference
A Novel Verification Method for Debug Tracing-in Close Chassis System
| Title: | A Novel Verification Method for Debug Tracing-in Close Chassis System |
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| Authors: | Pandey, Maneesh, Lekkala, Madhav |
| Source: | 2026 IEEE 10th International Test Conference India (ITC India) Test Conference India (ITC India), 2026 IEEE 10th International. :1-5 Jul, 2026 |
| Relation: | 2026 IEEE 10th International Test Conference India (ITC India) |
| Database: | IEEE Xplore Digital Library |
| ISBN: | 9798319505316 9798319505323 |
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| ISSN: | 28338391 28338383 |
| DOI: | 10.1109/ITCIndia70344.2026.11646554 |