Academic Journal
Performance Degradation Mechanisms in p-Type Nanosheet FETs: Role of Source/Drain Doping, Stress, and Inner Spacer Interface Traps
| Τίτλος: | Performance Degradation Mechanisms in p-Type Nanosheet FETs: Role of Source/Drain Doping, Stress, and Inner Spacer Interface Traps |
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| Συγγραφείς: | Hung, L., Bhuwalka, K.K., Stanojevic, Z., Schanovsky, F., Kosina, H., Karner, M. |
| Πηγή: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 73(9):5381-5386 Sep, 2026 |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
| ISSN: | 00189383 15579646 |
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| DOI: | 10.1109/TED.2026.3711954 |