Academic Journal
Automated Parallel Test Forms Assembly Using Integer Programming With Logistic Item Exposure Penalties to Balance the Number of Test Forms While Minimizing Item Exposure Bias
| Τίτλος: | Automated Parallel Test Forms Assembly Using Integer Programming With Logistic Item Exposure Penalties to Balance the Number of Test Forms While Minimizing Item Exposure Bias |
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| Συγγραφείς: | Fuchimoto, K., Ueno, M. |
| Πηγή: | IEEE Access Access, IEEE. 14:112268-112281 2026 |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
| ISSN: | 21693536 |
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| DOI: | 10.1109/ACCESS.2026.3715181 |