Conference
Industrial Application of Deep Learning based Fault Localization with Mutation Features
| Τίτλος: | Industrial Application of Deep Learning based Fault Localization with Mutation Features |
|---|---|
| Συγγραφείς: | Yang, Heechan, Lee, Ahcheong, Cho, Kyutae, Kim, Yunsam |
| Πηγή: | 2026 IEEE International Conference on Software Testing, Verification and Validation (ICST) ICST Software Testing, Verification and Validation (ICST), 2026 IEEE International Conference on. :180-190 May, 2026 |
| Relation: | 2026 IEEE International Conference on Software Testing, Verification and Validation (ICST) |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
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