Conference
Industrial Application of Deep Learning based Fault Localization with Mutation Features
| Title: | Industrial Application of Deep Learning based Fault Localization with Mutation Features |
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| Authors: | Yang, Heechan, Lee, Ahcheong, Cho, Kyutae, Kim, Yunsam |
| Source: | 2026 IEEE International Conference on Software Testing, Verification and Validation (ICST) ICST Software Testing, Verification and Validation (ICST), 2026 IEEE International Conference on. :180-190 May, 2026 |
| Relation: | 2026 IEEE International Conference on Software Testing, Verification and Validation (ICST) |
| Database: | IEEE Xplore Digital Library |
| ISBN: | 9798319533081 9798319533098 |
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| ISSN: | 21594848 |
| DOI: | 10.1109/ICST69053.2026.00032 |