APA (7th ed.) Citation

Ogura, R., & Karita, R. (2026). Formalizing Test Levels for Architectural Alignment and Overall Optimization. 2026 IEEE International Conference on Software Testing, Verification and Validation (ICST), Software Testing, Verification and Validation (ICST), 2026 IEEE International Conference on, ICST, 555. https://doi.org/10.1109/ICST69053.2026.00078

Chicago Style (17th ed.) Citation

Ogura, Riku, and Ren Karita. "Formalizing Test Levels for Architectural Alignment and Overall Optimization." 2026 IEEE International Conference on Software Testing, Verification and Validation (ICST), Software Testing, Verification and Validation (ICST), 2026 IEEE International Conference on, ICST 2026: 555. https://doi.org/10.1109/ICST69053.2026.00078.

MLA (9th ed.) Citation

Ogura, Riku, and Ren Karita. "Formalizing Test Levels for Architectural Alignment and Overall Optimization." 2026 IEEE International Conference on Software Testing, Verification and Validation (ICST), Software Testing, Verification and Validation (ICST), 2026 IEEE International Conference on, ICST, 2026, p. 555, https://doi.org/10.1109/ICST69053.2026.00078.