Conference
Formalizing Test Levels for Architectural Alignment and Overall Optimization
| Τίτλος: | Formalizing Test Levels for Architectural Alignment and Overall Optimization |
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| Συγγραφείς: | Ogura, Riku, Karita, Ren |
| Πηγή: | 2026 IEEE International Conference on Software Testing, Verification and Validation (ICST) ICST Software Testing, Verification and Validation (ICST), 2026 IEEE International Conference on. :555-565 May, 2026 |
| Relation: | 2026 IEEE International Conference on Software Testing, Verification and Validation (ICST) |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
| ISBN: | 9798319533081 9798319533098 |
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| ISSN: | 21594848 |
| DOI: | 10.1109/ICST69053.2026.00078 |