Using Analog IJTAG to Measure ISO 26262 Metrics

Λεπτομέρειες βιβλιογραφικής εγγραφής
Τίτλος: Using Analog IJTAG to Measure ISO 26262 Metrics
Συγγραφείς: Praselski, Bartlomiej, Sunter, Stephen
Πηγή: 2026 IEEE European Test Symposium (ETS) European Test Symposium (ETS), 2026 IEEE. :1-6 May, 2026
Relation: 2026 IEEE European Test Symposium (ETS)
Βάση Δεδομένων: IEEE Xplore Digital Library
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Header DbId: edseee
DbLabel: IEEE Xplore Digital Library
An: edseee.11591618
RelevancyScore: 1161
AccessLevel: 2
PubType: Conference
PubTypeId: conference
PreciseRelevancyScore: 1160.61328125
IllustrationInfo
Items – Name: Title
  Label: Title
  Group: Ti
  Data: Using Analog IJTAG to Measure ISO 26262 Metrics
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Praselski%2C+Bartlomiej%22">Praselski, Bartlomiej</searchLink><br /><searchLink fieldCode="AR" term="%22Sunter%2C+Stephen%22">Sunter, Stephen</searchLink>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: 2026 IEEE European Test Symposium (ETS) European Test Symposium (ETS), 2026 IEEE. :1-6 May, 2026
– Name: NoteTitleSource
  Label: Relation
  Group: SrcInfo
  Data: 2026 IEEE European Test Symposium (ETS)
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=edseee&AN=edseee.11591618
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1109/ETS69887.2026.11591618
    PhysicalDescription:
      Pagination:
        PageCount: 6
        StartPage: 1
    Titles:
      – TitleFull: Using Analog IJTAG to Measure ISO 26262 Metrics
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Praselski, Bartlomiej
      – PersonEntity:
          Name:
            NameFull: Sunter, Stephen
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 25
              M: 05
              Type: published
              Y: 2026
          Identifiers:
            – Type: isbn-print
              Value: 9798319517630
            – Type: isbn-print
              Value: 9798319517647
            – Type: issn-print
              Value: 15581780
            – Type: issn-print
              Value: 15301877
            – Type: issn-locals
              Value: edseee.IEEEConferenc
          Titles:
            – TitleFull: 2026 IEEE European Test Symposium (ETS), European Test Symposium (ETS), 2026 IEEE
              Type: main
ResultId 1