Conference
Using Analog IJTAG to Measure ISO 26262 Metrics
| Τίτλος: | Using Analog IJTAG to Measure ISO 26262 Metrics |
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| Συγγραφείς: | Praselski, Bartlomiej, Sunter, Stephen |
| Πηγή: | 2026 IEEE European Test Symposium (ETS) European Test Symposium (ETS), 2026 IEEE. :1-6 May, 2026 |
| Relation: | 2026 IEEE European Test Symposium (ETS) |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
| ISBN: | 9798319517630 9798319517647 |
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| ISSN: | 15581780 15301877 |
| DOI: | 10.1109/ETS69887.2026.11591618 |